Eon-LT PC-Based Monitor your quartz thin film controller.
Film Thickness Monitor with Temperature Measurement
The EonLT is a PC based Film Thickness Monitor that enables a simple feature set for users who do not need process or temperature control, it is a Quartz Thin Film Controller by preference. The EonLT offers innovative monitoring, with a technology that has been streamlined to provide a more compact, low-cost unit. The Eon-LT is a temperature measuring film thickness monitor which surpasses conventional monitors that are blind to thermal changes of the crystal.
The combination of frequency and temperature measurement allows unprecedented correctness in real-time rate and thickness monitoring.
Features | Applications |
---|---|
Temperature measuring quartz oscillator | Atomic Layer Deposition (ALD) |
Communicates with latest, intuitive Eon™ software | Chemical Vapor Deposition (CVD) |
Real time graphing of temperature and frequency alongside corresponding rate and thickness values | Molecular Beam Epitaxy (MBE) |
Shutter on/off support (relays) | CIGS (thin film solar) |
All connecting cables, software, and instruction manual included | OLED (display & lighting) |
Features built in temperature monitoring | Multi-Layer Optical Thin Film Deposition |
Eon-ID Monitor w/Integrated Display
Comprehensive, Versatile Film Thickness Monitor.
Eon-ID is a versatile, affordable thin film deposition monitoring. Eon-ID new film thickness monitor packages an ultra-high resolution deposition measurement system into a compact, rack mountable enclosure. Eon-ID film thickness monitor is the only product of its kind that works right out of the box. Eon-ID offers an all-inclusive design that adapts easily to a variety of settings – ranging from industrial to laboratory to clean room to research environments.
With its temperature monitoring capability, touchscreen display, and sturdy industry-ready design, Eon-ID presents an all-in-one solution.
Features | Applications |
---|---|
Integrated touchscreen display for process programming and monitoring | Atomic Layer Deposition (ALD) |
Connectivity includes RS-232 | Chemical Vapor Deposition (CVD) |
Rackmount capable (1 or 2 Eon-IDs per slot) | Molecular Beam Epitaxy (MBE) |
Dual sensor for expanded capability | CIGS (thin film solar) |
Advanced technology that increases reliability and durability in industrial environments | OLED (display & lighting) |
Features built in temperature monitoring | Multi-Layer Optical Thin Film Deposition |
Roll-to-roll coating | Roll-to-roll coating |
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