Phoenix™ Film Thickness Sensor

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FEATURES OF Film Thickness Sensor

Temperature fluctuation is the most significant cause of frequency drift in crystals. Standard water-cooled sensor can experience a 20°C discrepancy within 10 minutes during high-rate deposition. In an industry of nanometer measurements, this level of variance will easily result in significant inaccuracy with thickness reading. Thus, Colnatec has conceived and created the Phoenix™ film thickness sensor.

Phoenix™ Film Thickness Sensor

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