Quartz Thin Film Controller

Eon-LT PC-Based Monitor your quartz thin film controller.

Film Thickness Monitor with Temperature Measurement

The EonLT is a PC based Film Thickness Monitor that enables a simple feature set for users who do not need process or temperature control, it is a Quartz Thin Film Controller by preference. The EonLT offers innovative monitoring, with a technology that has been streamlined to provide a more compact, low-cost unit. The Eon-LT is a temperature measuring film thickness monitor which surpasses conventional monitors that are blind to thermal changes of the crystal.

The combination of frequency and temperature measurement allows unprecedented correctness in real-time rate and thickness monitoring.

Artz thin film controller
Temperature measuring quartz oscillatorAtomic Layer Deposition (ALD)
Communicates with latest, intuitive Eon™ softwareChemical Vapor Deposition (CVD)
Real time graphing of temperature and frequency alongside corresponding rate and thickness valuesMolecular Beam Epitaxy (MBE)
Shutter on/off support (relays)CIGS (thin film solar)
All connecting cables, software, and instruction manual includedOLED (display & lighting)
Features built in temperature monitoringMulti-Layer Optical Thin Film Deposition
Eon-ID Monitor w/Integrated Display
Eon-ID Monitor w/Integrated Display

Eon-ID Monitor w/Integrated Display

Comprehensive, Versatile Film Thickness Monitor.

Eon-ID is a versatile, affordable thin film deposition monitoring.  Eon-ID new film thickness monitor packages an ultra-high resolution deposition measurement system into a compact, rack mountable enclosure. Eon-ID film thickness monitor is the only product of its kind that works right out of the box. Eon-ID offers an all-inclusive design that adapts easily to a variety of settings – ranging from industrial to laboratory to clean room to research environments.

With its temperature monitoring capability, touchscreen display, and sturdy industry-ready design, Eon-ID presents an all-in-one solution.

Integrated touchscreen display for process programming and monitoringAtomic Layer Deposition (ALD)
Connectivity includes RS-232Chemical Vapor Deposition (CVD)
Rackmount capable (1 or 2 Eon-IDs per slot)Molecular Beam Epitaxy (MBE)
Dual sensor for expanded capabilityCIGS (thin film solar)
Advanced technology that increases reliability and durability in industrial environmentsOLED (display & lighting)
Features built in temperature monitoringMulti-Layer Optical Thin Film Deposition
Roll-to-roll coatingRoll-to-roll coating

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