How hydrocarbons background overlap is prevented during secondary ion mass spectrometry on rocks?
Scanning Electron Microscopy: Sample preparation secrets: How hydrocarbons background overlap is prevented during secondary ion mass spectrometry on rocks? Sample preparation secrets A refurbished geophysical science laboratory in a wide Midwestern Research University is now equipped with a new Focus Ion Beam Fiels Emission Scanning Electron Microscope (FIB-FESEM) and searches to maximize the use and … Read more